发明名称 |
ETCHING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of controlling an etching solution reducing the amount of cerium ammonium nitrate and perchloric acid and also giving an excellent etching face in a method of subjecting a chromium film to etching with an etching solution containing cerium ammonium nitrate and perchloric acid. SOLUTION: The amount of cerium ammonium nitrate is controlled in such a manner that the weight ratio of tetravalent cerium to hexavalent chromium in an etching solution regulated to 40 to 60.
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申请公布号 |
JP2001098391(A) |
申请公布日期 |
2001.04.10 |
申请号 |
JP20000219571 |
申请日期 |
2000.07.19 |
申请人 |
MITSUBISHI CHEMICALS CORP |
发明人 |
ISHIKAWA MAKOTO;MIYOSHI MASARU |
分类号 |
C23F1/26;H01L21/306;(IPC1-7):C23F1/26 |
主分类号 |
C23F1/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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