| 摘要 |
PROBLEM TO BE SOLVED: To reduce a data storage amount required for a failure analysis, by a method wherein a logic output expected-value pattern in replaced with a defect logic output pattern, and failure detection results in the execution of failure simulations are compared. SOLUTION: A logic input pattern 1 and a logic output expected-value pattern 2 are inputted, a failure simulation 5A is executed, and an expected-value failure detection result 6 is obtained. On the other hand, the logic output expected-value pattern 2 is replaced with a defect logic output pattern 4 from a defect logic integrated circuit 10, a failure simulation 5B is executed, and a defect failure detection result 7 is obtained. Then, a comparison means 8 compares the expected-value detection result 6 with the defect failure detection result 7, and it points out a failure-place candidate point on the basis of result data from a disagreement node 9. As a result, the creation of a failure dictionary in every failure simulation is omitted, and it is possible to eliminate enormous storage data for the failure dictionary.
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