发明名称 METHOD AND STRUCTURE FOR FORMING FINFET CMOS WITH DUAL DOPED STI REGIONS
摘要 A method of making a semiconductor device includes forming a first fin of a first transistor in a substrate; forming a second fin of a second transistor in the substrate; disposing a first doped oxide layer including a first dopant onto the first fin and the second fin, the first dopant being an n-type dopant or a p-type dopant; disposing a mask over the first fin and removing the first doped oxide layer from the second fin; removing the mask and disposing a second doped oxide layer onto the first doped oxide layer over the first doped oxide layer covering the first fin and directly onto the second fin, the second doped oxide layer including an n-type dopant or a p-type dopant that is different than the first dopant; and annealing to drive in the first dopant into a portion of the first fin and the second dopant into a portion of the second fin.
申请公布号 US2017069541(A1) 申请公布日期 2017.03.09
申请号 US201615357201 申请日期 2016.11.21
申请人 International Business Machines Corporation 发明人 Basker Veeraraghavan S.;Cheng Kangguo;Standaert Theodorus E.;Wang Junli
分类号 H01L21/8234;H01L21/308 主分类号 H01L21/8234
代理机构 代理人
主权项 1. A method of making a semiconductor device, the method comprising: forming a first fin of a first transistor in a substrate; forming a second fin of a second transistor in the substrate; disposing a first doped oxide layer comprising a first dopant onto the first fin and the second fin, the first dopant being an n-type dopant or a p-type dopant; disposing a mask over the first fin and removing the first doped oxide layer from the second fin; removing the mask and disposing a second doped oxide layer onto the first doped oxide layer over the first fin and directly onto the second fin, the second doped oxide layer comprising an n-type dopant or a p-type dopant that is different than the first dopant; annealing to drive in the first dopant into a portion of the first fin and the second dopant into a portion of the second fin; etching to remove the second doped oxide layer; depositing an oxide between the first fin and the second fin; and forming a first gate on the first fin and a second gate on the second fin.
地址 Armonk NY US