发明名称 |
METHOD AND APPARATUS FOR GENERATING DEPTH IMAGE |
摘要 |
A depth image generating apparatus includes a light source configured to emit light; an optical shutter provided on a path of the light reflected by an object and configured to modulate a waveform of the reflected light by changing a transmissivity of the optical shutter with respect to the reflected light; a driver configured to apply a driving voltage to the light source and a driving voltage to the optical shutter; a temperature measurer configured to measure a temperature of the optical shutter; a controller configured to control driving voltages; and a depth information obtainer configured to generate an image corresponding to the reflected light that passes through the optical shutter, extract a phase difference between a phase of the light emitted by the light source to the object and a phase of the reflected light, and obtain depth information regarding the object based on the phase difference. |
申请公布号 |
US2017127047(A1) |
申请公布日期 |
2017.05.04 |
申请号 |
US201615196710 |
申请日期 |
2016.06.29 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
JEON Myungjae;PARK Yonghwa;YOU Jangwoo;CHO Yongchul |
分类号 |
H04N13/02;G01S17/08;G01S17/89 |
主分类号 |
H04N13/02 |
代理机构 |
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代理人 |
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主权项 |
1. A depth image generating apparatus comprising:
a light source configured to emit light towards an object so that the light is reflected by the object; an optical shutter provided on a path of the light reflected by the object and configured to modulate a waveform of the reflected light by changing a transmissivity of the optical shutter with respect to the reflected light; a driver configured to apply a driving voltage to the light source and a driving voltage to the optical shutter; a temperature measurer configured to measure a temperature of the optical shutter; a controller configured to control a driving voltage applied to the driver based on the temperature measured by the temperature measurer; and a depth information obtainer configured to generate an image corresponding to the reflected light that passes through the optical shutter, extract a phase difference between a phase of the light emitted by the light source to the object and a phase of the reflected light, and obtain depth information regarding the object based on the phase difference. |
地址 |
Suwon-si KR |