发明名称 X-ray analysis apparatus
摘要 An X-ray analysis apparatus for detecting, using an X-ray detector, X-rays given off by a sample when the sample is irradiated with X-rays, the X-ray analysis apparatus having replaceable components. The X-ray analysis apparatus comprises labels attached to the replaceable components and including symbols indicating the types of replaceable components, a camera for photographing the replaceable components and the labels, and CPU and image recognition software for specifying the types of replaceable components by calculation based on the symbols in the labels.
申请公布号 US9618461(B2) 申请公布日期 2017.04.11
申请号 US201314050676 申请日期 2013.10.10
申请人 RIGAKU CORPORATION 发明人 Ohara Takao;Wakasaya Kenji;Ozawa Tetsuya;Nishi Kunio
分类号 G01N23/20;G01T7/00 主分类号 G01N23/20
代理机构 Buchanan Ingersoll & Rooney PC 代理人 Buchanan Ingersoll & Rooney PC
主权项 1. An X-ray analysis apparatus for detecting, using an X-ray detector, X-rays given off by a sample when the sample is irradiated with X-rays, the X-ray analysis apparatus being capable of carrying out multiple types of measurements and comprising multiple types of replaceable components, the X-ray analysis apparatus comprising: indicators provided on the replaceable components; a camera for photographing the replaceable components and the indicators; control means for analyzing images photographed by the camera and carrying out the various types of measurements, wherein: the indicators include information indicating type names of the replaceable components, information indicating positions where the replaceable components are mounted, and information indicating directions of the replaceable components, andthe control means determines whether types of the replaceable components, positions of the replaceable components and directions of the replaceable components are correct or not with respect to the measurement types, based upon the information indicting type names of the replaceable components, the information indicating positions where the replaceable components are mounted, and the information indicating directions of the replaceable components photographed by the camera.
地址 Akishima-Shi, Tokyo JP