发明名称 ELECTRONIC APPARATUS, SYSTEM FOR ESTIMATING DEGRADATION OF INTERNAL POWER SUPPLY, AND METHOD OF ESTIMATING DEGRADATION OF INTERNAL POWER SUPPLY
摘要 An electronic apparatus includes: an internal power supply to be charged; a charging circuit configured to supply electrical power from an external power supply to the internal power supply; a voltage measurement circuit configured to measure a voltage of the internal power supply; a temperature sensor configured to measure a temperature of the internal power supply; and an estimation circuit configured to estimate a degree of degradation of the internal power supply, wherein the estimation circuit determines whether it is possible to perform a degradation estimation process to estimate the degree of degradation of the internal power supply based on the voltage of the internal power supply and the temperature of the internal power supply, and performs the degradation estimation process on the internal power supply only when determining that it is possible to perform the degradation estimation process on the internal power supply.
申请公布号 US2016131721(A1) 申请公布日期 2016.05.12
申请号 US201514926573 申请日期 2015.10.29
申请人 Konica Minolta, Inc. 发明人 IKEDA Yuki;EGUCHI Yoshihiko
分类号 G01R31/40;H02J7/00 主分类号 G01R31/40
代理机构 代理人
主权项 1. An electronic apparatus comprising: an internal power supply to be charged; a charging circuit configured to supply electrical power from an external power supply to the internal power supply; a voltage measurement circuit configured to measure a voltage of the internal power supply; a temperature sensor configured to measure a temperature of the internal power supply; and an estimation circuit configured to estimate a degree of degradation of the internal power supply, wherein the estimation circuit determines whether it is possible to perform a degradation estimation process to estimate the degree of degradation of the internal power supply based on the voltage of the internal power supply measured by the voltage measurement circuit and the temperature of the internal power supply measured by the temperature sensor, and performs the degradation estimation process on the internal power supply only when determining that it is possible to perform the degradation estimation process on the internal power supply.
地址 Tokyo JP