发明名称 |
SCINTILLATOR PANEL AND RADIATION DETECTOR |
摘要 |
A scintillator panel includes a scintillator layer that includes a phosphor including columnar crystals in which an X-ray rocking curve of a specific plane index measured by applying an X-ray to a columnar crystal growth ending surface after cutting to have a thickness of 5 μm from a columnar crystal growth starting surface has a half-width (a) of equal to or less than 15 degrees, an X-ray rocking curve of the specific plane index measured by applying an X-ray to the columnar crystal growth ending surface without cutting has a half-width (b) of equal to or less than 15 degrees, and a ratio (a/b) is within a range of from 0.5 to 2.0. The scintillator panel can provide radiation images having higher sharpness. |
申请公布号 |
US2016124095(A1) |
申请公布日期 |
2016.05.05 |
申请号 |
US201514923699 |
申请日期 |
2015.10.27 |
申请人 |
Konica Minolta, Inc. |
发明人 |
Hasegawa Atsushi;Maeda Keiko |
分类号 |
G01T1/20;G01T1/161 |
主分类号 |
G01T1/20 |
代理机构 |
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代理人 |
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主权项 |
1. A scintillator panel comprising:
a support body; and a scintillator layer formed on the support body, the scintillator layer including a phosphor comprising columnar crystals and the columnar crystals being formed from a columnar crystal growth starting surface of the scintillator layer to a columnar crystal growth ending surface thereof over an entire thickness direction of the scintillator layer, wherein in the scintillator layer, an X-ray rocking curve of a specific plane index measured by applying an X-ray to the columnar crystal growth ending surface after cutting to have a thickness of 5 μm from the columnar crystal growth starting surface has a half-width (a) of equal to or less than 15 degrees; an X-ray rocking curve of the specific plane index measured by applying an X-ray to the columnar crystal growth ending surface without cutting has a half-width (b) of equal to or less than 15 degrees; and a ratio (a/b) of the half-width (a) to the half-width (b) is from 0.5 to 2.0. |
地址 |
Tokyo JP |