发明名称 METHOD FOR MANUFACTURING SEMICONDUCTOR MEMORY DEVICE AND SEMICONDUCTOR MEMORY DEVICE
摘要 According to one embodiment, a method for manufacturing a semiconductor memory device includes simultaneously forming a plurality of first holes and a plurality of second holes in a stacked body. The stacked body includes a plurality of first layers and a plurality of second layers. The method includes etching a portion between the second holes next to each other in the stacked body, and connecting at least two or more second holes to form a groove. The method includes forming a film including a charge storage film on a sidewall of the first holes. The method includes forming a channel film on a sidewall of the film including the charge storage film.
申请公布号 US2016126252(A1) 申请公布日期 2016.05.05
申请号 US201514639084 申请日期 2015.03.04
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TSUDA Hirotaka;OSHIKI Yusuke
分类号 H01L27/115;H01L21/02;H01L21/28;H01L21/311 主分类号 H01L27/115
代理机构 代理人
主权项 1. A method for manufacturing a semiconductor memory device, comprising: simultaneously forming a plurality of first holes and a plurality of second holes in a stacked body, the first holes and the second holes being periodically arrayed, the stacked body including a plurality of first layers and a plurality of second layers, each of the second layers provided between the first layers; etching a portion between the second holes next to each other in the stacked body, and connecting at least two or more second holes to form a groove; forming a film including a charge storage film on a sidewall of the first holes; and forming a channel film on a sidewall of the film including the charge storage film.
地址 Tokyo JP