发明名称 |
METHOD FOR MANUFACTURING SEMICONDUCTOR MEMORY DEVICE AND SEMICONDUCTOR MEMORY DEVICE |
摘要 |
According to one embodiment, a method for manufacturing a semiconductor memory device includes simultaneously forming a plurality of first holes and a plurality of second holes in a stacked body. The stacked body includes a plurality of first layers and a plurality of second layers. The method includes etching a portion between the second holes next to each other in the stacked body, and connecting at least two or more second holes to form a groove. The method includes forming a film including a charge storage film on a sidewall of the first holes. The method includes forming a channel film on a sidewall of the film including the charge storage film. |
申请公布号 |
US2016126252(A1) |
申请公布日期 |
2016.05.05 |
申请号 |
US201514639084 |
申请日期 |
2015.03.04 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
TSUDA Hirotaka;OSHIKI Yusuke |
分类号 |
H01L27/115;H01L21/02;H01L21/28;H01L21/311 |
主分类号 |
H01L27/115 |
代理机构 |
|
代理人 |
|
主权项 |
1. A method for manufacturing a semiconductor memory device, comprising:
simultaneously forming a plurality of first holes and a plurality of second holes in a stacked body, the first holes and the second holes being periodically arrayed, the stacked body including a plurality of first layers and a plurality of second layers, each of the second layers provided between the first layers; etching a portion between the second holes next to each other in the stacked body, and connecting at least two or more second holes to form a groove; forming a film including a charge storage film on a sidewall of the first holes; and forming a channel film on a sidewall of the film including the charge storage film. |
地址 |
Tokyo JP |