发明名称 RESIST UNDERLAYER COMPOSITION AND METHOD FOR FORMING PATTERN USING SAME
摘要 An under-layer composition of resist having superior thermal stability, etching resistance, gap-filling property and void-preventing property, and a method for forming pattern using the same are disclosed. The under-layer composition of resist comprises: an aromatic ring containing polymer having the repeating unit of the following Formula 1; a compound of the following Formula 4; and an organic solvent.;;in Formula 1, R1 is a monocyclic or polycyclic aromatic hydrocarbon group having 5 to 20 carbon atoms, R2 and R3 is independently a monocyclic or polycyclic aromatic hydrocarbon group having 4 to 14 carbon atoms, a is an integer of 1 to 3, and b is an integer of 0 to 2.;;in Formula 4, n is an integer of 1 to 250.
申请公布号 US2016053132(A1) 申请公布日期 2016.02.25
申请号 US201414779769 申请日期 2014.03.24
申请人 DONGJIN SEMICHEM CO., LTD. 发明人 LEE Jung-Youl;LIM Young Bae;KIM Jong-Won;LEE Jae Woo;KIM Jae Hyun
分类号 C09D165/02;G03F7/40 主分类号 C09D165/02
代理机构 代理人
主权项 1. An under-layer composition of resist comprising: an aromatic ring containing polymer having the repeating unit of the following Formula 1, in Formula 1, R1 is a monocyclic or polycyclic aromatic hydrocarbon group having 5 to 20 carbon atoms, R2 and R3 is independently a monocyclic or polycyclic aromatic hydrocarbon group having 4 to 14 carbon atoms, a is an integer of 1 to 3, and b is an integer of 0 to 2; a compound of the following Formula 4, in Formula 4, n is an integer of 1 to 250; and an organic solvent.
地址 Incheon KR