| 发明名称 | Test device and operating method thereof | ||
| 摘要 | A test device includes a circuit modelling portion suitable for generating one or more model circuits by modelling a test-object circuit with a one-to-one or a one-to-multi relationship between the test-object circuit and the model circuits, and a test operation portion suitable for synthesizing the model circuits and performing a test operation on the model circuits. | ||
| 申请公布号 | US9262291(B2) | 申请公布日期 | 2016.02.16 |
| 申请号 | US201414509884 | 申请日期 | 2014.10.08 |
| 申请人 | SK Hynix Inc. | 发明人 | Kim Jin-Wook |
| 分类号 | G06F17/50;G06F11/26 | 主分类号 | G06F17/50 |
| 代理机构 | IP & T Group LLP | 代理人 | IP & T Group LLP |
| 主权项 | 1. A test device comprising: a circuit modelling portion suitable for generating one or more model circuits by modelling a test-object circuit in a one-to-one ratio relationship between the test-object circuit and the model circuits or in a one-to-multi ratio relationship between the test-object circuit and the model circuits; and a test operation portion suitable for synthesizing the model circuits and performing a test operation on the model circuits, wherein the circuit modelling portion models the test-object circuit with the one-to-multi relationship to generate the model circuits of different types based on a delay amount of the test-object circuit. | ||
| 地址 | Gyeonggi-do KR | ||