| 摘要 |
A semiconductor memory apparatus comprises: a cyclic redundancy check (CRC) circuit block electrically coupled to a data pad, and configured to generate internal CRC information from data received from the data pad; and a comparison unit configured to compare external CRC information received from outside of the semiconductor memory apparatus with the internal CRC information, and generate a read training result signal. Therefore, the semiconductor memory apparatus reduces time necessary for a training operation. |
