发明名称 REFRACTOMETER
摘要 PROBLEM TO BE SOLVED: To provide a refractometer capable of measuring an accurate refractive index by suppressing incidence of disturbance light into a prism, and enabling visual confirmation of the state of a dropped sample. SOLUTION: A polarizing plate 5 for cutting P-polarized light Rp is held openably/closably through a hinge 6 on the upper surface of a sample part 1. As for the disturbance light entering the prism 4, P-polarized light Rp having strong intensity is removed, and only S-polarized light Rs having weak intensity is remained, and scattered light inside the prism 4 is greatly reduced, and noise light entering a photoelectric detector 3 is reduced. Hereby, a light quantity distribution curve Vp acquired from an output signal from the photoelectric detector 3 is separated clearly from a low value to a high value before and after a critical angle θc, and thereby the critical angle θc can be specified easily, and a highly-accurate refractive index can be measured. Further, state observation of the sample S from the outside can be possible as before. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011112598(A) 申请公布日期 2011.06.09
申请号 JP20090271408 申请日期 2009.11.30
申请人 SHIMADZU CORP 发明人 KAWADA MASARU
分类号 G01N21/41 主分类号 G01N21/41
代理机构 代理人
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