发明名称 |
METHODS FOR FABRICATING INTEGRATED CIRCUITS WITH IMPROVED IMPLANTATION PROCESSES |
摘要 |
Methods for fabricating integrated circuits are provided. In an embodiment, a method for fabricating an integrated circuit includes providing a structure having an n-channel gate stack and a p-channel gate stack formed over a semiconductor substrate. The method includes forming halo implant regions in the semiconductor substrate adjacent the p-channel gate stack and forming extension implant regions in the semiconductor substrate adjacent the p-channel gate stack. The method further includes annealing the halo implant regions and the extension implant regions in the semiconductor substrate adjacent the p-channel gate stack by performing a laser anneal process. Also, the method forms extension implant regions in the semiconductor substrate adjacent the n-channel gate stack. |
申请公布号 |
US2015287646(A1) |
申请公布日期 |
2015.10.08 |
申请号 |
US201414244651 |
申请日期 |
2014.04.03 |
申请人 |
GLOBALFOUNDRIES, Inc. |
发明人 |
Zaka Alban;Yan Ran;Bazizi El Mehdi;Hoentschel Jan |
分类号 |
H01L21/8238;H01L29/167;H01L21/324;H01L29/66;H01L21/265;H01L21/266 |
主分类号 |
H01L21/8238 |
代理机构 |
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代理人 |
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主权项 |
1. A method for fabricating an integrated circuit, the method comprising:
providing a structure having an n-channel gate stack and a p-channel gate stack formed over a semiconductor substrate; forming halo implant regions in the semiconductor substrate adjacent the p-channel gate stack; forming extension implant regions in the semiconductor substrate adjacent the p-channel gate stack; annealing the halo implant regions and the extension implant regions in the semiconductor substrate adjacent the p-channel gate stack by performing a laser anneal process; and forming extension implant regions in the semiconductor substrate adjacent the n-channel gate stack. |
地址 |
Grand Cayman KY |