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发明名称
METHOD OF DETERMINING STRAIN-ELECTRIC CHARACTERISTICS OF METAL-SEMICONDUCTOR STRUCTURE
摘要
申请公布号
SU1506400(A1)
申请公布日期
1989.09.07
申请号
SU19864116879
申请日期
1986.09.10
申请人
SP O PROEKTNO-KONSTRUKTORSKO-TEKHNOLOGICHESKOE BYURO SO VASKHNIL
发明人
KOZEEV EVGENIJ V,SU;BONDAR ALEKSANDR P,SU
分类号
G01R31/26
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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