发明名称 低温基板上の薄膜の側方熱処理を提供する方法
摘要 <p>A method for thermally processing a minimally absorbing thin film in a selective manner is disclosed. Two closely spaced absorbing traces are patterned in thermal contact with the thin film. A pulsed radiant source is used to heat the two absorbing traces, and the thin film is thermally processed via conduction between the two absorbing traces. This method can be utilized to fabricate a thin film transistor (TFT) in which the thin film is a semiconductor and the absorbers are the source and the drain of the TFT.</p>
申请公布号 JP5780682(B2) 申请公布日期 2015.09.16
申请号 JP20130514223 申请日期 2011.06.02
申请人 发明人
分类号 H01L21/20;H01L21/336;H01L29/786 主分类号 H01L21/20
代理机构 代理人
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