发明名称 METAL ASSISTED ETCH COMBINED WITH REGULARIZING ETCH
摘要 In an aspect of the disclosure, a process for forming nanostructuring on a silicon-containing substrate is provided. The process comprises (a) performing metal-assisted chemical etching on the substrate, (b) performing a clean, including partial or total removal of the metal used to assist the chemical etch, and (c) performing an isotropic or substantially isotropic chemical etch subsequently to the metal-assisted chemical etch of step (a). In an alternative aspect of the disclosure, the process comprises (a) performing metal-assisted chemical etching on the substrate, (b) cleaning the substrate, including removal of some or all of the assisting metal, and (c) performing a chemical etch which results in regularized openings in the silicon substrate.
申请公布号 WO2015038340(A1) 申请公布日期 2015.03.19
申请号 WO2014US53000 申请日期 2014.08.27
申请人 BANDGAP ENGINEERING, INC. 发明人 YIM, JOANNE;MILLER, JEFF;JURA, MICHAEL;BLACK, MARCIE, R.;FORZIATI, JOANNE;MURPHY, BRIAN;MAGLIOZZI, LAUREN
分类号 H01L21/306;B82Y40/00 主分类号 H01L21/306
代理机构 代理人
主权项
地址