发明名称 LOW TEMPERATURE PLASMA ANNEAL PROCESS FOR SUBLIMATIVE ETCH PROCESSES
摘要 <p>Methods for etching a material layer disposed on the substrate using a low temperature etching process along with a subsequent low temperature plasma annealing process are provided. In one embodiment, a method for etching a material layer disposed on a substrate includes transferring a substrate having a material layer disposed thereon into an etching processing chamber, supplying an etching gas mixture into the processing chamber, remotely generating a plasma in the etching gas mixture to etch the material layer disposed on the substrate, and plasma annealing the material layer at a substrate temperature less than 100 degrees Celsius.</p>
申请公布号 WO2015030968(A1) 申请公布日期 2015.03.05
申请号 WO2014US48195 申请日期 2014.07.25
申请人 APPLIED MATERIALS, INC. 发明人 NEMANI, SRINIVAS D.;KANG, SEAN;PENDER, JEREMIAH T.;KAO, CHIA-LING;BELOSTOTSKIY, SERGEY G.;ZHU, LINA
分类号 H01L21/3065;H01L21/324 主分类号 H01L21/3065
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