发明名称 RADIATION DETECTOR, RADIATION INSPECTION APPARATUS USING RADIATION DETECTOR, AND RADIATION IMAGING APPARATUS USING RADIATION DETECTOR
摘要 PROBLEM TO BE SOLVED: To provide a radiation detector capable of suppressing an influence of energy resolution or the like on performance by suppressing characteristic change of a semiconductor radiation detection unit, and a radiation inspection apparatus and a radiation imaging apparatus each using the radiation detector.SOLUTION: A radiation detector includes: a plurality of semiconductor radiation detection units each detecting a radiation; a power supply applying a bias voltage to the semiconductor radiation detection units; and an application-direction switching mechanism switching a direction of the bias voltage applied to the semiconductor radiation detection units from the power supply over between a forward direction and an opposite direction, only the bias voltage in the forward direction being applied to the semiconductor radiation detection units when detection processing for detecting the radiation is carried out, and characteristic recovery processing involving application of the bias voltage at least in the opposite direction being carried out at timing other than timing of the detection processing.
申请公布号 JP2015040791(A) 申请公布日期 2015.03.02
申请号 JP20130172559 申请日期 2013.08.22
申请人 HITACHI ALOKA MEDICAL LTD 发明人 ISHIZU TAKAAKI;KIYONO TOMOYUKI;TAKAHASHI ISAO;KOMINAMI SHINYA;UENO YUICHIRO
分类号 G01T1/24;G01T1/161 主分类号 G01T1/24
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