发明名称 INSPECTION POINT SETTING DEVICE AND PROGRAM
摘要 <p>PROBLEM TO BE SOLVED: To provide an inspection point setting device capable of easily setting an inspection point to a solid pattern.SOLUTION: The inspection point setting device includes: displaying means capable of displaying an image; data reading means for reading substrate data; display processing means for displaying a conductor pattern of a substrate on the displaying means on the basis of the substrate data; selecting means for selecting a conductor pattern as a setting object of an inspection point; contraction processing means for contracting a solid pattern 60 of the setting object selected by the selecting means and displaying it on the displaying means; and inspection point setting means for setting inspection points TP1, TP2, and TP3 to the solid pattern 60.</p>
申请公布号 JP2015010925(A) 申请公布日期 2015.01.19
申请号 JP20130136205 申请日期 2013.06.28
申请人 HIOKI EE CORP 发明人 OKANE KAZUYUKI
分类号 G01R31/02;H05K3/00 主分类号 G01R31/02
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