发明名称 |
Probe for inspecting the surface of a circumferential slot in a turbojet disk by means of eddy currents |
摘要 |
A probe for eddy current monitoring of the surface of a circumferential slot formed in a turbojet disk. The probe includes a stem fastened to a support and a first multi-element sensor constrained to move with the stem and configured to be inserted into the circumferential slot to perform the inspection, and a second multi-element sensor. The two multi-element sensors are disposed back to back, and the stem of the probe is mounted to pivot about its own axis to enable the two multi-element sensors to be inserted in the slot. |
申请公布号 |
US8866471(B2) |
申请公布日期 |
2014.10.21 |
申请号 |
US200912992514 |
申请日期 |
2009.05.13 |
申请人 |
SNECMA |
发明人 |
Cabanis Patrick;Cheynet Sandra;Gaisnon Patrick;Ravize Luc |
分类号 |
G01N27/82;G01N27/90 |
主分类号 |
G01N27/82 |
代理机构 |
Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P. |
代理人 |
Oblon, Spivak, McClelland, Maier & Neustadt, L.L.P. |
主权项 |
1. An eddy current probe for monitoring a surface of a circumferential slot formed in a turbojet disk, the probe comprising:
a stem fastened to a support at a first end of the stem; a first multi-element sensor that performs an inspection, constrained to move with the stem and configured to be inserted into the circumferential slot; and a second multi-element sensor, wherein the first and second multi-element sensors are disposed back to back at a second end of the stem, and the stem is pivotable about an axis thereof such that in a first position of the probe, the first and second multi-element sensors are aligned with and insertable into the circumferential slot, and in a second position of the probe which is 90° about the axis of the stem from the first position, the first and second multi-element sensors abut corresponding side faces of the circumferential slot. |
地址 |
Paris FR |