发明名称 PLASMA ETCHING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method of forming an etching structure having a predetermined tapered shape of which the diameter is reduced from an opening to a bottom.SOLUTION: An initial step P, a first processing step A, a second processing step B and a third processing step C are applied to a silicon substrate K. The processing steps A, B and C are the steps of implementing multiple times a cycle of successively repeating a protective film forming process and two etching processes. The first processing step A and the second processing step B are configured at least to gradually shorten a processing time, gradually decrease pressure within a processing chamber or gradually decrease power applied to a base in accordance with the repetition of the cycle in at least one of the two etching processes. The third processing step C is configured at least to prolong a processing time, increase pressure within the processing chamber or increase power applied to the base in accordance with the repetition of the cycle in at least one of the two etching processes.
申请公布号 JP2014195027(A) 申请公布日期 2014.10.09
申请号 JP20130071331 申请日期 2013.03.29
申请人 SPP TECHNOLOGIES CO LTD 发明人 SASAKURA MASAHIRO;YAMAMOTO TAKASHI;SENHO MITSUNARI
分类号 H01L21/3065;H01L21/336;H01L29/78 主分类号 H01L21/3065
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