| 摘要 |
The present invention relates to the field of data processing. A defect prediction method and device, the method comprising: from a pre-stored product failure record selecting a training attribute set based on a target attribute, and combining the target attribute with the training attribute set to form a training set (101); the target attribute is the defect attribute of a historical faulty product; generating a classifier collection according to the training set, the classifier collection comprising at least two tree classifiers (102); and utilizing the classifier collection as a prediction model to predict the defects of a faulty product (103). The method is used in the defect prediction process of a faulty product to realize accurate and quick locating of a faulty product. |
