发明名称 OXIDE SEMICONDUCTOR THIN FILM TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME
摘要 A method for manufacturing an oxide semiconductor thin film transistor (TFT) is provided, which includes the steps below. A source electrode and a drain electrode are provided. A patterned insulating layer is formed to partially cover the source electrode and the drain electrode, and expose a portion of the source electrode and a portion of the drain electrode. An oxide semiconductor layer is formed to contact the portion of the source electrode and the portion of the drain electrode. A gate electrode is provided. A gate dielectric layer positioned between the oxide semiconductor layer and the gate electrode is provided. An oxide semiconductor TFT is also provided herein.
申请公布号 US2014225194(A1) 申请公布日期 2014.08.14
申请号 US201313905140 申请日期 2013.05.30
申请人 CHUNGHWA PICTURE TUBES, LTD. 发明人 CHANG Hsi-Ming
分类号 H01L29/786;H01L29/66 主分类号 H01L29/786
代理机构 代理人
主权项 1. A method for manufacturing an oxide semiconductor thin film transistor (TFT), comprising the steps of: providing a source electrode and a drain electrode; forming a patterned insulating layer to partially cover the source electrode and the drain electrode, wherein the patterned insulating layer includes at least one opening exposing a portion of the source electrode and a portion of the drain electrode, and the opening has a length greater than the distance between the source electrode and the drain electrode; forming an oxide semiconductor layer to contact the portion of the source electrode and the portion of the drain electrode; providing a gate electrode; and providing a gate dielectric layer positioned between the oxide semiconductor layer and the gate electrode.
地址 Taoyuan TW