发明名称 |
OXIDE SEMICONDUCTOR THIN FILM TRANSISTOR AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
A method for manufacturing an oxide semiconductor thin film transistor (TFT) is provided, which includes the steps below. A source electrode and a drain electrode are provided. A patterned insulating layer is formed to partially cover the source electrode and the drain electrode, and expose a portion of the source electrode and a portion of the drain electrode. An oxide semiconductor layer is formed to contact the portion of the source electrode and the portion of the drain electrode. A gate electrode is provided. A gate dielectric layer positioned between the oxide semiconductor layer and the gate electrode is provided. An oxide semiconductor TFT is also provided herein. |
申请公布号 |
US2014225194(A1) |
申请公布日期 |
2014.08.14 |
申请号 |
US201313905140 |
申请日期 |
2013.05.30 |
申请人 |
CHUNGHWA PICTURE TUBES, LTD. |
发明人 |
CHANG Hsi-Ming |
分类号 |
H01L29/786;H01L29/66 |
主分类号 |
H01L29/786 |
代理机构 |
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代理人 |
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主权项 |
1. A method for manufacturing an oxide semiconductor thin film transistor (TFT), comprising the steps of:
providing a source electrode and a drain electrode; forming a patterned insulating layer to partially cover the source electrode and the drain electrode, wherein the patterned insulating layer includes at least one opening exposing a portion of the source electrode and a portion of the drain electrode, and the opening has a length greater than the distance between the source electrode and the drain electrode; forming an oxide semiconductor layer to contact the portion of the source electrode and the portion of the drain electrode; providing a gate electrode; and providing a gate dielectric layer positioned between the oxide semiconductor layer and the gate electrode. |
地址 |
Taoyuan TW |