发明名称 METHODS OF FORMING A PATTERN
摘要 A method includes forming a hydrophilic guide layer, a DBARC layer and a photoresist film. A portion of the photoresist film and DBARC layer is exposed to form exposed and unexposed portions. The unexposed photoresist film is removed to form a photoresist pattern including the exposed photoresist film portion. A neutral layer is formed on the photoresist pattern. The photoresist pattern and the DBARC layer of the exposed portion are removed to form first opening portions exposing the guide layer. A block copolymer layer includes a block copolymer having first and second polymer blocks coated on the neutral layer while filling the first opening portions. The block copolymer layer is microphase separated to form a pattern layer including first and second patterns. A pattern including one polymer block is removed to form a pattern mask. The object layer is etched to form a pattern including second opening portions.
申请公布号 US2014061154(A1) 申请公布日期 2014.03.06
申请号 US201313905662 申请日期 2013.05.30
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM EUN-SUNG;NAM JAE-WOO;SHIN CHUL-HO;YI SHI-YONG
分类号 G03F7/00 主分类号 G03F7/00
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