发明名称 RESIST COMPOSITION AND METHOD FOR PRODUCING RESIST PATTERN
摘要 PROBLEM TO BE SOLVED: To provide a resist composition from which a resist pattern with excellent line edge roughness can be produced.SOLUTION: The resist composition comprises a resin including a structural unit having an acid labile group, a compound expressed by formula (I), and an acid generator expressed by formula (II). In the formulae, Rand Reach represent a hydrocarbon group, alkoxy group, acyl group, acyloxy group, alkoxycarbonyl group, nitro group or halogen atom; m' and n' each represent an integer of 0 to 4; Xrepresents an alkanediyl group optionally having a substituent, in which a methylene group included in the alkanediyl group may be replaced by an oxygen atom or a carbonyl group; Rrepresents a hydrocarbon group optionally having a substituent, in which a methylene group included in the hydrocarbon group may be replaced by an oxygen atom or a carbonyl group; and Zrepresents an organic cation.
申请公布号 JP2014029495(A) 申请公布日期 2014.02.13
申请号 JP20130126755 申请日期 2013.06.17
申请人 SUMITOMO CHEMICAL CO LTD 发明人 ICHIKAWA KOJI;MUKAI YUICHI;YASUE TAKAHIRO
分类号 G03F7/004;G03F7/038;G03F7/039;H01L21/027 主分类号 G03F7/004
代理机构 代理人
主权项
地址