发明名称 Method for Forming Silicon-Containing Dielectric Film by Cyclic Deposition with Side Wall Coverage Control
摘要 A method of forming a dielectric film having Si-C bonds and/or Si-N bonds on a semiconductor substrate by cyclic deposition, includes: (i) conducting one or more cycles of cyclic deposition in a reaction space wherein a semiconductor substrate is placed, using a Si-containing precursor and a reactant gas; and (ii) before or after step (i), applying a pulse of RF power to the reaction space while supplying a rare gas and a treatment gas without supplying a Si-containing precursor, whereby a dielectric film having Si-C bonds and/or Si-N bonds is formed on the semiconductor substrate.
申请公布号 US2013330933(A1) 申请公布日期 2013.12.12
申请号 US201213493897 申请日期 2012.06.11
申请人 FUKAZAWA ATSUKI;OKA TAKAHIRO;ASM IP HOLDING B.V. 发明人 FUKAZAWA ATSUKI;OKA TAKAHIRO
分类号 H01L21/31 主分类号 H01L21/31
代理机构 代理人
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