发明名称 METHODS OF FORMING SEMICONDUCTOR STRUCTURES
摘要 In a method of forming a semiconductor structure, a through-silicon-via (TSV) opening is formed in a substrate. A dielectric layer is formed to continuously extend over the substrate and into the TSV opening. At least one conductive material is formed over the dielectric layer and in the TSV opening. A portion of the at least one conductive material that is over the dielectric layer is removed to form a TSV structure in the substrate. A metallic line is formed in the dielectric layer. A portion of the substrate is removed, such that the TSV structure continuously extends through the substrate and the dielectric layer.
申请公布号 US2013252422(A1) 申请公布日期 2013.09.26
申请号 US201313905302 申请日期 2013.05.30
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHIOU WEN-CHIH;WU TSANG-JIUH;YANG KU-FENG;CHEN HSIN-YU
分类号 H01L21/768 主分类号 H01L21/768
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