Integrated Circuit Testing Method

摘要

A method for testing an integrated circuit includes determining performance data of the integrated circuit, wherein at least first and second derivatives of S parameters of the integrated circuit are taken into account when determining the expected performance data. The performance data can be determined by measuring S parameters of the integrated circuit. An equivalent non-linear model of the integrated circuit can be determined from the provided S parameters and first and second derivatives of the provided S parameters. The non-linear behavior of the integrated circuit can be quantified from the equivalent non-linear model.