发明名称 Reference artifact for calibrating X-ray and Method for correcting resolution of the X-ray using the same
摘要 PURPOSE: A standard specimen for correcting X-rays and a method for correcting resolution using the same are provided to use a standard specimen for correcting X-rays having a single set standard, thereby easily proceed a correction and the verification of X-ray inspection equipment. CONSTITUTION: A method for correcting resolution using a standard specimen for correcting X-rays is as follows. A standard specimen for correcting X-rays is prepared in X-ray inspection equipment at a first fixed distance(S500). The X-ray inspection equipment transmits X-rays to the standard specimen so that images with respect to a first standard shape among two or more standard shapes are obtained(S510). A first correction value is obtained by calculating the resolution of the standard shape per pixels with the obtained images(S520). The first correction value is set as an inspection standard value, thereby being saved(S530). [Reference numerals] (AA) Start; (BB) Finish; (S500) Placing a standard specimen on an inspection device spaced at a first distance; (S510) Obtaining images of a first standard shape by transmitting X-rays; (S520) Obtaining a first correction value by calculating the resolution of a standard shape per pixels; (S530) Saving a correction value as a standard value
申请公布号 KR101282984(B1) 申请公布日期 2013.07.05
申请号 KR20110036537 申请日期 2011.04.20
申请人 发明人
分类号 G01N23/00;G01N23/04 主分类号 G01N23/00
代理机构 代理人
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