发明名称 TRENCH-TYPE INSULATED GATE BIPOLAR TRANSISTOR AND METHOD FOR FABRICATING THE SAME
摘要 <p>A trench-type insulated gate bipolar transistor and a method for fabricating the same are provided. The trench-type insulated gate bipolar transistor comprises a collector layer (220), a drift layer (240), a base layer (250), an emitter layer (260), a groove (290), and a gate dielectric layer (291) and a gate electrode (292) formed in the groove (290). An upper surface of the gate electrode (292) in the groove (290) is etched back below an upper surface of the base layer (250), so that the emitter layer (260) is formed operable by inclined ion implantation. The method comprise a back etching step of the gate electrode (292) and a step to form the emitter layer (260) by use of the gate electrode (292) as a mask and inclined ion implantation. The trench-type insulated gate bipolar transistor fabricated by the method has a small on-resistance and can reduce the chip area.</p>
申请公布号 WO2013067888(A1) 申请公布日期 2013.05.16
申请号 WO2012CN83411 申请日期 2012.10.24
申请人 CSMC TECHNOLOGIES FAB1 CO.,LTD. 发明人 LIU, SHAOPENG
分类号 H01L29/423;H01L21/266;H01L21/28;H01L21/331;H01L29/739 主分类号 H01L29/423
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