发明名称 Forming Wafer-Level Chip Scale Package Structures with Reduced number of Seed Layers
摘要 A method includes forming a passivation layer over a metal pad, which is overlying a semiconductor substrate. A first opening is formed in the passivation layer, with a portion of the metal pad exposed through the first opening. A seed layer is formed over the passivation layer and to electrically coupled to the metal pad. The seed layer further includes a portion over the passivation layer. A first mask is formed over the seed layer, wherein the first mask has a second opening directly over at least a portion of the metal pad. A PPI is formed over the seed layer and in the second opening. A second mask is formed over the first mask, with a third opening formed in the second mask. A portion of a metal bump is formed in the third opening. After the step of forming the portion of the metal bump, the first and the second masks are removed.
申请公布号 US2013009307(A1) 申请公布日期 2013.01.10
申请号 US201113179299 申请日期 2011.07.08
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.;LU WEN-HSIUNG;CHENG MING-DA;LIN CHIH-WEI;WU YI-WEN;LIN HSIU-JEN;LIU CHUNG-SHI;LII MIRNG-JI;YU CHEN-HUA 发明人 LU WEN-HSIUNG;CHENG MING-DA;LIN CHIH-WEI;WU YI-WEN;LIN HSIU-JEN;LIU CHUNG-SHI;LII MIRNG-JI;YU CHEN-HUA
分类号 H01L23/498;H01L21/60 主分类号 H01L23/498
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