发明名称 Semiconductor package, method of evaluating same, and method of manufacturing same
摘要 A semiconductor package includes a wiring board, a semiconductor device mounted on the wiring board, an electrically-conductive thermal interface material provided on the semiconductor device, a test electrode in contact with a first surface of the thermal interface material to be electrically connected to the thermal interface material, and an electrically-conductive heat spreader in contact with a second surface of the thermal interface material opposite to its first surface.
申请公布号 US8350263(B2) 申请公布日期 2013.01.08
申请号 US20100913844 申请日期 2010.10.28
申请人 SHINKO ELECTRIC INDUSTRIES CO., LTD.;ODA TAKUYA 发明人 ODA TAKUYA
分类号 H01L23/34 主分类号 H01L23/34
代理机构 代理人
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