发明名称 Semiconductor thin film structure and method of forming the same
摘要 PURPOSE: A semiconductor film structure and a method for forming the same are provided to increase internal quantum efficiency by forming a nitride semiconductor thin film of low defect density. CONSTITUTION: A plurality of empty spaces(C) are separately formed on a substrate(10). An inorganic film(30) is formed on the substrate. An inorganic film has 2D arrangement. A nitride semiconductor thin film is formed on the substrate. A structure of the nitride semiconductor thin film is two or more layers.
申请公布号 KR20120129439(A) 申请公布日期 2012.11.28
申请号 KR20110047692 申请日期 2011.05.20
申请人 发明人
分类号 H01L21/20 主分类号 H01L21/20
代理机构 代理人
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