A docking device (10) for connecting a semiconductor probe (2) to a semiconductor handler (1) has in each case one probe-side and one handler-side connecting device (11, 12), a handling device (31-35) for handling a contact-making device (23) and a coupling device (13-16) for coupling the connecting devices (11, 12). The coupling device (13-16) has a first shifting device, which allows the translational and guided shifting of the probe-side connecting device (12) relative to the handler-side connecting device (11) towards and away from one another.
