发明名称 Nonvolatile semiconductor memory device
摘要 An object is to provide a nonvolatile semiconductor memory device which is superior in writing property and charge holding property. A semiconductor substrate in which a channel formation region is formed between a pair of impurity regions is provided, and a first insulating layer, a floating gate electrode, a second insulating layer, and a control gate electrode are provided over the semiconductor substrate. The floating gate electrode includes at least two layers. It is preferable that a band gap of a first floating gate electrode, which is in contact with the first insulating layer, be smaller than that of the semiconductor substrate. It is also preferable that a second floating gate electrode be formed of a metal material, an alloy material, or a metal compound material. This is because, by lowering the bottom energy level of a conduction band of the floating gate electrode than that of the channel formation region in the semiconductor substrate, a carrier injecting property and a charge holding property can be improved.
申请公布号 US8022460(B2) 申请公布日期 2011.09.20
申请号 US20070725487 申请日期 2007.03.20
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 YAMAZAKI SHUNPEI;ASAMI YOSHINOBU;TAKANO TAMAE;FURUNO MAKOTO
分类号 H01L29/76 主分类号 H01L29/76
代理机构 代理人
主权项
地址