发明名称 SPALLING FOR A SEMICONDUCTOR SUBSTRATE
摘要 <p>A method for spalling a layer from an ingot of a semiconductor substrate includes forming a metal layer on the ingot of the semiconductor substrate, wherein a tensile stress in the metal layer is configured to cause a fracture in the ingot; and removing the layer from the ingot at the fracture. A system for spalling a layer from an ingot of a semiconductor substrate includes a metal layer formed on the ingot of the semiconductor substrate, wherein a tensile stress in the metal layer is configured to cause a fracture in the ingot, and wherein the layer is configured to be removed from the ingot at the fracture.</p>
申请公布号 CA2783380(A1) 申请公布日期 2011.09.01
申请号 CA20112783380 申请日期 2011.02.16
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BEDELL, STEPHEN W.;FOGEL, KEITH E.;LAURO, PAUL, A.;SADANA, DEVENDRA;SHAHRJERDI, DAVOOD
分类号 H01L21/304;B28D5/00 主分类号 H01L21/304
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