CIRCUIT FOR TESTING INTERNAL VOLTAGE OF SEMICONDUCTOR MEMORY APPARATUS

摘要

An internal voltage test circuit of a semiconductor memory apparatus includes a comparing unit for comparing a level of internal voltage with a level of external voltage to output a comparison result as an output signal during a test mode, and an output selecting unit for outputting the output signal to a data output pad during the test mode, and outputting a data signal to the data output pad during a normal operation mode.