发明名称 ABRASIVE FOR COPPER AND CHEMICAL MECHANICAL POLISHING METHOD
摘要 PROBLEM TO BE SOLVED: To provide an abrasive for copper and a chemical mechanical polishing method using the abrasive, which polish a copper film at a high speed with high flatness, finish polishing in a short period of time, and secure sufficient productivity even in applications in which grinding a thick metal film such as a high performance wiring board or a TSV is needed. SOLUTION: The abrasive for copper contains inorganic acid, amino acid, protective film forming agent, abrasive grain, oxidizing agent, organic acid, and water, wherein the inorganic acid contains at least both sulfuric acid and phosphoric acid, and the pH of the abrasive is larger than the pKa of the amino acid and organic acid, and is 4.0 or less. COPYRIGHT: (C)2011,JPO&INPIT
申请公布号 JP2011119380(A) 申请公布日期 2011.06.16
申请号 JP20090274246 申请日期 2009.12.02
申请人 HITACHI CHEM CO LTD 发明人 MABUCHI KATSUMI;AMANOKURA HITOSHI;ONO YUTAKA;HONBO MICHIKO
分类号 H01L21/304;B24B37/00;C09K3/14 主分类号 H01L21/304
代理机构 代理人
主权项
地址
您可能感兴趣的专利