发明名称 Surface profiling apparatus
摘要 Broadband light is directed along sample and reference paths such that light reflected by a sample surface and light reflected by a reference surface interfere. A mover effects relative movement between the sample and reference surfaces along a scan path. A detector senses a series of light intensity values representing interference fringes produced by a sample surface region during the movement. A data processor processes the intensity values as they are received to produce coherence peak position data and, after completion of a measurement operation, uses this coherence peak position data to obtain data indicative of the height of the surface region. The data processor includes a correlator for correlating intensity values with correlation function data to provide correlation data to enable identification of a position of a coherence peak. A surface topography determiner determines a height of a sample surface region from coherence peak position data.
申请公布号 US7948634(B2) 申请公布日期 2011.05.24
申请号 US20080115955 申请日期 2008.05.06
申请人 TAYLOR HOBSON LIMITED 发明人 BANKHEAD ANDREW DOUGLAS;MCDONNELL IVOR
分类号 G01B11/02;G01B9/02 主分类号 G01B11/02
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