发明名称 Word line compensation in non-volatile memory erase operations
摘要 Compensation voltage(s) are applied to a non-volatile memory system during erase operations to equalize the erase behavior of memory cells. Compensation voltages can compensate for voltages capacitively coupled to memory cells of a NAND string from other memory cells and/or select gates. A compensation voltage can be applied to one or more memory cells to substantially normalize the erase behavior of the memory cells. A compensation voltage can be applied to end memory cells of a NAND string to equalize their erase behavior with interior memory cells of the NAND string. A compensation voltage can also be applied to interior memory cells to equalize their erase behavior with end memory cells. Additionally, a compensation voltage can be applied to one or more select gates of a NAND string to compensate for voltages coupled to one or more memory cells from the select gate(s). Various compensation voltages can be used.
申请公布号 EP2306463(A1) 申请公布日期 2011.04.06
申请号 EP20100012052 申请日期 2005.12.15
申请人 发明人
分类号 G11C16/16;G11C8/08;G11C16/04;G11C16/34 主分类号 G11C16/16
代理机构 代理人
主权项
地址