发明名称 Nonvolatile memory devices and methods of forming the same
摘要 A nonvolatile memory device includes a semiconductor substrate of a first conductivity type, a plurality of word lines on the semiconductor substrate, each the plurality of word lines including a floating gate of a second conductivity type. A ground select line and a string select line are disposed on respective sides of word lines. An impurity region of the second conductivity type underlies a first word line adjacent the ground select line. The device may further include a second impurity region of the second conductivity type underlying a second word line adjacent the string select line. In still further embodiments, the device may further include third impurity regions of the second conductivity type underlying respective third word lines between the first word line and the second word line. Methods of forming such devices are also provided.
申请公布号 US7920418(B2) 申请公布日期 2011.04.05
申请号 US20080972243 申请日期 2008.01.10
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE SEUNG-CHUL;LEE KEUN-HO;LEE CHOONG-HO;CHOI BYUNG-YONG
分类号 G11C11/34 主分类号 G11C11/34
代理机构 代理人
主权项
地址