发明名称 DISPLAY APPARATUS AND METHOD OF TESTING THE SAME
摘要 A display apparatus includes a delay generation circuit that generates a reference signal and a competing signal, the competing signal being generated based on a delay set signal, an input order judgment circuit that judges an input order of the reference signal and the competing signal, a delay set circuit that generates the delay set signal based on a judgment result in the input order judgment circuit, and an internal synchronous control circuit that controls transfer of display data between a CPU and a display panel. An operation test of the internal synchronous control circuit is performed using the reference signal and the competing signal. Hence, fault coverage can be enhanced.
申请公布号 US2011001739(A1) 申请公布日期 2011.01.06
申请号 US20100783879 申请日期 2010.05.20
申请人 NEC ELECTRONICS CORPORATION 发明人 YAMAGISHI NOBUHISA
分类号 G06F3/038 主分类号 G06F3/038
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