发明名称 Manufacturing methods of SOI substrate and semiconductor device
摘要 A manufacturing method of an SOI substrate and a manufacturing method of a semiconductor device are provided. When a large-area single crystalline semiconductor film is formed over an enlarged substrate having an insulating surface, e.g., a glass substrate by an SOI technique, the large-area single crystalline semiconductor film is formed without any gap between plural single crystalline semiconductor films, even when plural silicon wafers are used. An aspect of the manufacturing method includes the steps of disposing a first seed substrate over a fixing substrate; tightly arranging a plurality of single crystalline semiconductor substrates over the first seed substrate to form a second seed substrate; forming a large-area continuous single crystalline semiconductor film by an ion implantation separation method and an epitaxial growth method; forming a large-area single crystalline semiconductor film without any gap over a large glass substrate by an ion implantation separation method again.
申请公布号 US7795114(B2) 申请公布日期 2010.09.14
申请号 US20080219650 申请日期 2008.07.25
申请人 SEMICONDUCTOR ENERGY LABORATORY CO., LTD. 发明人 MORIWAKA TOMOAKI
分类号 H01L21/30 主分类号 H01L21/30
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