发明名称 Method and Composition for Chemical Mechanical Planarization of A Metal
摘要 A composition and associated method for chemical mechanical planarization of a metal-containing substrate (e.g., a copper substrate) are described herein which afford high and tunable rates of metal removal as well as low within a wafer non-uniformity values and low residue levels remaining after polishing.
申请公布号 US2010167545(A1) 申请公布日期 2010.07.01
申请号 US20090632111 申请日期 2009.12.07
申请人 DUPONT AIR PRODUCTS NANOMATERIALS LLC 发明人 SHI XIAOBO;PALMER BENTLEY J.;SAWAYDA REBECCA A.;CODER FADI ABDALLAH;PEREZ VICTORIA
分类号 H01L21/306;C09K13/00 主分类号 H01L21/306
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