| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide a parallel resistance measuring method and a device therefor capable of determining a value of an equivalent parallel resistance by applying a direct current into a capacitive test device, and reducing cost by reducing a device scale. Ž<P>SOLUTION: The capacitive test device is charged with a prescribed charging current as long as a prescribed charging period by using a charging circuit. A both terminal voltage of an equivalent capacity at a middle spot of the charging period is measured as the first middle voltage Vmid. A both terminal voltage of the equivalent capacity at the finish point of time of the charging period is measured as a charge finish voltage Vc-end. A half of the charge finish voltage Vc-end is calculated as the second middle voltage Vhalf. Then, a differential voltage Vdm (=Vmid-Vhalf) between the first middle voltage Vmid and the second middle voltage Vhalf is determined. Thereafter, a resistance value of the equivalent parallel resistance corresponding to the calculated differential voltage Vdm is determined from a relation between a resistance value of the equivalent parallel resistance corresponding to a capacitance of the equivalent capacity determined beforehand and the differential voltage Vdm. Ž<P>COPYRIGHT: (C)2010,JPO&INPIT Ž
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