发明名称 TRENCH ISOLATION FOR REDUCED CROSS TALK
摘要 A starting substrate in the form of a semiconductor wafer (1) has a first side and a second side, the sides being plane-parallel with respect to each other, and has a thickness rendering it suitable for processing without significant risk of being damaged, for the fabrication of combined analogue and digital designs, the wafer including at least two partitions (A1, A2; DIGITAL, ANALOGUE) electrically insulated from each other by insulating material (2; 38; 81; L) extending entirely through the wafer. A method for making such substrates including etching trenches in a wafer, and filling trenches with insulating material is also described.
申请公布号 US2009302414(A1) 申请公布日期 2009.12.10
申请号 US20080523786 申请日期 2008.01.25
申请人 SILEX MICROSYSTEMS AB 发明人 EBEFORS THORBJOERN;BAUER TOMAS
分类号 H01L29/06;H01L21/762 主分类号 H01L29/06
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