发明名称 Quasi-differential read operation
摘要 A memory device includes an array portion of resistive memory cells comprising a plurality of bit line pairs. The device further includes a read circuit operably associated with a first charged line, wherein the read circuit comprises a precharge circuit configured to charge a first line at a first rate, and to charge a second line at a second rate, the first and second charge rates based on a state of a memory cell coupled between the respective lines. The read circuit may further include a ground circuit configured to pull the respective lines to a ground potential, and a sense circuit coupled to the line pair configured to sense a differential voltage between the line pair in response to the state of the memory cell.
申请公布号 US7570507(B2) 申请公布日期 2009.08.04
申请号 US20070771312 申请日期 2007.06.29
申请人 INFINEON TECHNOLOGIES NORTH AMERICA CORP. 发明人 NIRSCHL THOMAS
分类号 G11C11/00 主分类号 G11C11/00
代理机构 代理人
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