发明名称 Verfahren zum Steuern der Morphologie während der Bildung einer epitaktischen Schicht
摘要 A first aspect of the invention provides a method of selectively forming an epitaxial layer on a substrate. The method includes heating the substrate to a temperature of less than about 800° C. and employing both silane and dichlorosilane as silicon sources during epitaxial film formation. Numerous other aspects are provided.
申请公布号 DE112007001813(T5) 申请公布日期 2009.07.09
申请号 DE20071101813T 申请日期 2007.07.30
申请人 APPLIED MATERIALS INC. 发明人 KIM, YIHWAN;LAM, ANDREW M.
分类号 H01L21/36 主分类号 H01L21/36
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