发明名称 SURFACE-EMITTING SEMICONDUCTOR LASER ARRAY DEVICE OF WHICH RELIABILITY IS IMPROVED BY STRESS CONTROL OF INTERLAYER INSULATING FILM
摘要 PROBLEM TO BE SOLVED: To provide a vertical-cavity surface-emitting laser (VCSEL) array device of high reliability by allowing stress generated near an active layer to be controlled by an interlayer insulating film. SOLUTION: A VCSEL array device 20 includes a plurality of mesa portions 24 serving as light emitting portions, on a substrate 22. Internal stress generated between an oxidized region provided near the active layer and the interlayer insulating film can be reduced by using a separation groove 30 formed on a surface protection film 32 covering the interlayer insulating film, so that the increase of dislocations is suppressed, so that the VCSEL array device of high reliability is available. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009147287(A) 申请公布日期 2009.07.02
申请号 JP20080067035 申请日期 2008.03.17
申请人 FUJI XEROX CO LTD 发明人 MATSUSHITA KAZUMASA;UEKI NOBUAKI
分类号 H01S5/183;H01S5/026 主分类号 H01S5/183
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