| 摘要 |
A calibration method for an edge inspection apparatus which is provided with: a light emitting portion which irradiates inspection light onto an edge of a substrate being inspected; and a detection portion which detects optical characteristics of reflection light which is reflected by the edge of the substrate being inspected to detect the defect occurring in the edge of the substrate being inspected based on the optical characteristics of the reflected light detected by the detection portion, wherein the calibration method including: a pseudo-defect formation step of forming a plurality of pseudo-defects on an edge of a substrate for calibration which serves as a reference along a circumferential direction thereof, in which at least one of a position in the thickness direction of the substrate, the shape, and the size is set so as to be different between the pseudo-defects; a detection step of irradiating the inspection light onto the respective pseudo-defects, and detecting the optical characteristics of the reflection light by the detection portion; and an adjustment step of calibrating the edge inspection apparatus based on the optical characteristics of the reflection light detected from the respective pseudo-defects.
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